The effects of interface and bulk traps in an MOS system in the time and the frequency domain by I. S. Sifri
Material type: TextLanguage: English Publication details: 1980Description: v , 88 leaves : ill. ; 31 cmSubject(s): LOC classification:- TK7871.99.M44S54 1980
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
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المكتبة الرئيسية غرفة رسائل الماجستير و الدكتوراة - الطابق الرئيسي | THS | TK7871.99.M44S54 1980 (Browse shelf(Opens below)) | 1 | Available | E44779 c.1. |
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003102
M
1980
December 1980
Thesis (M.S) (Electrical and Electronic Engineering) - Wales University , 1980
Includes bibliographical references (leaves 87-88)
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