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The effects of interface and bulk traps in an MOS system in the time and the frequency domain by I. S. Sifri

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Material type: Text

TextLanguage: English Publication details: 1980Description: v , 88 leaves : ill. ; 31 cmSubject(s):

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Dissertation note: 003102M1980

Item type: Master Thesis

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
PRINT	المكتبة الرئيسية غرفة رسائل الماجستير و الدكتوراة - الطابق الرئيسي	THS	TK7871.99.M44S54 1980 (Browse shelf(Opens below))	1	Available		E44779 c.1.

003102

1980

December 1980

Thesis (M.S) (Electrical and Electronic Engineering) - Wales University , 1980

Includes bibliographical references (leaves 87-88)

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