The effects of interface and bulk traps in an MOS system in the time and the frequency domain
Sifri, I. S.
The effects of interface and bulk traps in an MOS system in the time and the frequency domain by I. S. Sifri - 1980 - v , 88 leaves : ill. ; 31 cm.
December 1980 Thesis (M.S) (Electrical and Electronic Engineering) - Wales University , 1980 Includes bibliographical references (leaves 87-88)
Metal oxide semiconductors - Design and construction--TK
TK7871.99.M44S54 1980
The effects of interface and bulk traps in an MOS system in the time and the frequency domain by I. S. Sifri - 1980 - v , 88 leaves : ill. ; 31 cm.
December 1980 Thesis (M.S) (Electrical and Electronic Engineering) - Wales University , 1980 Includes bibliographical references (leaves 87-88)
Metal oxide semiconductors - Design and construction--TK
TK7871.99.M44S54 1980
