Fundamentals of nanoscale film analysis Terry L. Alford , Leonard C. Feldman , James W. Mayer

By: Material type: TextTextLanguage: English Publication details: Springer; New York; 2007; c2007Description: xiv , 336 p. : ill. ; 24 cmISBN:
  • 9780387292601
Subject(s): LOC classification:
  • QC176.83.A44 2006
Item type: PRINT
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Item type Current library Call number Copy number Status Date due Barcode
PRINT PRINT المكتبة الرئيسية الطابق الثاني أ QC176.83.A44 2006 (Browse shelf(Opens below)) 1 Available 0000078612

Includes bibliographical references and index

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