New horizons in testing : latent trait test theory and computerized adaptive testing edited by David J. Weiss ; contributors , R. Darrell Bock ... [et al.]

By: Contributor(s): Material type: TextTextLanguage: English Publication details: Academic Press; New York; 1983; 1983Description: xvii, 345 p. :ill. ;24 cmISBN:
  • 0127427805 (alk. paper)
Subject(s): LOC classification:
  • BF176.N48 1983
Item type: PRINT
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Item type Current library Call number Copy number Status Date due Barcode
PRINT PRINT المكتبة الرئيسية الطابق الثالث أ BF176.N48 1983 (Browse shelf(Opens below)) 1 Available E58707

Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.

Includes bibliographies and indexes

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