Fundamentals of nanoscale film analysis Terry L. Alford , Leonard C. Feldman , James W. Mayer
Material type: TextLanguage: English Publication details: Springer; New York; 2007; c2007Description: xiv , 336 p. : ill. ; 24 cmISBN:- 9780387292601
- QC176.83.A44 2006
Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
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المكتبة الرئيسية الطابق الثاني أ | QC176.83.A44 2006 (Browse shelf(Opens below)) | 1 | Available | 0000078612 |
Includes bibliographical references and index
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