Saeks, Richard , 1941- <br/><br/>
Rational fault analysis 
edited by Richard Saeks, Stanley R. Liberty 
 -  M. Dekker New York  1977  c1977 
 - ix, 241 p. : ill. ; 24 cm. 
 - Electrical engineering and electronics  1 .
<br/><br/> Co-sponsored by the Office of Naval Research and the Army Research Office.  Includes bibliographies and index. 
<br/><br/><label>ISBN: </label>0824765419 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic apparatus and appliances - Testing - Congresses<br/>Electronic apparatus and appliances - Reliability - Congresses<br/>Automatic checkout equipment - Congresses--TK
<br/><br/><label>LC Class. No.: </label>TK7870.S945 1974