TY  - GEN
AU  - Trump, Benjamin F.
TI  - Diagnostic electron microscopy
SN  - 0471891959 v.1
AV  - RB43.5.D53 
PB  - Wiley
KW  - Diagnosis , Electron microscopic
KW  - Microscopy , Electron
KW  - Diagnosis , Laboratory -- Instrumentation
KW  - RB
N1  - Includes bibliographical references and indexes; BZU has v.4. only
ER  -