Fundamentals of nanoscale film analysis Terry L. Alford , Leonard C. Feldman , James W. Mayer

By: Material type: TextTextLanguage: English Publication details: Springer; New York; 2007; c2007Description: xiv , 336 p. : ill. ; 24 cmISBN:
  • 9780387292601
Subject(s): LOC classification:
  • QC176.83.A44 2006
Item type: PRINT
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Item type Current library Call number Copy number Status Date due Barcode
PRINT PRINT المكتبة الرئيسية الطابق الثاني أ QC176.83.A44 2006 (Browse shelf(Opens below)) 1 Available 0000078612
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QC176.8.T4P37 Thermal conductivity of solids QC176.8.T4T45 Thermally stimulated relaxation in solids QC176.8.W3D5 1980 Elastic waves in solids : applications to signal processing QC176.83.A44 2006 Fundamentals of nanoscale film analysis QC176.83.E2613 Physics of thin films QC176.83.E2613 1986 Physics of thin films QC176.83.L48 1978 Nucleation and growth of thin films

Includes bibliographical references and index

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